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Test Data Generation for Arithmetic Subsystem of CPUs MIPS64.
The main problem is test data generation for arithmetic subsystem testing of CPUs MIPS64. A method is proposed to solve this problem. The method uses a formal description of processor functionality. A language for this description is proposed also. This language permits automatic test data generation.Full text of the paper in pdf
Proceedings of SYRCoSE'08, Volume 2, pp.43-46.