Preprints of the Institute for System Programming of RAS, Preprint 21, 2008 г.
Alexander Kamkin. Combinatorial Model-Based Test Program Generation for Microprocessors. pp. 1-16.
In this paper we describe a method of automated test program generation intended for systematic functional verification of microprocessors. The method supplements such widely-spread practical approaches as software-based verification and random generation. In our method, construction of test programs is based on microprocessor model, which includes structural model and instruction set model. The goal of generation is defined by means of instruction-level test coverage. Test programs are constructed by combining test situations for different sequences of instructions.