Институт системного программирования им. В.П. Иванникова РАН


Automated Generation of Positive and Negative Tests for Parsers.

Авторы

S.Zelenov, S.Zelenova.

Аннотация

In this paper we describe a specification-based approach to automated generation of both positive and negative test sets for parsers. We propose coverage criteria definitions for such test sets and algorithms for generation of the test sets with respect to proposed coverage criteria. We also present practical results of the technique application to testing syntax analyzers of several languages including C and Java.

Издание

Proc. of the 5th Int. Workshop on Formal Approaches to Testing of Software (FATES 2005), LNCS 3997, Springer-Verlag, Berlin, 2006, 187-202.

DOI: 10.1007/11759744_13

Научная группа

Технологии программирования

Все публикации за 2006 год Все публикации