Automated Generation of Positive and Negative Tests for Parsers.
Automated Generation of Positive and Negative Tests for Parsers.
Authors
Abstract
In this paper we describe a specification-based approach to automated generation of both positive and negative test sets for parsers. We propose coverage criteria definitions for such test sets and algorithms for generation of the test sets with respect to proposed coverage criteria. We also present practical results of the technique application to testing syntax analyzers of several languages including C and Java.
Edition
Proc. of the 5th Int. Workshop on Formal Approaches to Testing of Software (FATES 2005), LNCS 3997, Springer-Verlag, Berlin, 2006, 187-202.
DOI: 10.1007/11759744_13
Research Group
All publications during 2006
All publications