Test Data Generation for LRU Cache-Memory testing.

Test Data Generation for LRU Cache-Memory testing.

Authors

Evgeni Kornikhin.

Abstract

System functional testing of microprocessors deals with many assembly programs of given behavior. The paper proposes new constraint-based algorithm of initial cache-memory contents generation for given behavior of assembly program (with
cache misses and hits). Although algorithm works for any types of cache-memory, the paper describes algorithm in detail for basis types of cache-memory only: fully associative cache and direct mapped cache.

Full text of the paper in pdf

Edition

SYRCoSE'09, pp.88-92.

DOI: 10.15514/SYRCOSE-2009-3-16

ISBN 978-5-91474-013-6

Research Group

Software Engineering

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