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Test Data Generation for Arithmetic Subsystem of CPUs MIPS64.
Test Data Generation for Arithmetic Subsystem of CPUs MIPS64.
Authors
E. Kornikhin.
Abstract
The main problem is test data generation for arithmetic subsystem testing of CPUs MIPS64. A method is proposed to solve this problem. The method uses a formal description of processor functionality. A language for this description is proposed also. This language permits automatic test data generation.
Full text of the paper in pdfEdition
Proceedings of SYRCoSE'08, Volume 2, pp.43-46.
DOI: 10.15514/SYRCOSE-2008-2-20
ISBN 978-5-91474-006-8.
Research Group
All publications during 2008
All publications